Fluke Fellows

Biography

Jeff is the Chief Corporate Metrologist for Fluke. Since joining in 2010, he has driven improvements in measurement quality for engineering, manufacturing, and service activities for Fluke and Fortive organizations worldwide. He has been a key contributor to developing international standards and practices for calibration laboratories and was a writing group member for ISO 17025:2017, ISO 17043:2010 and ILAC P14-2020. In 2011, before joining Fluke, Jeff co-authored publications with NIST and served as a consultant to NIST and UNIDO. Jeff has a bachelor’s degree in physics from Purdue University.

Published Works

Jeff Gust is behind multiple published works exploring electromagnetic measurements, calibration and laboratory testing. You can view them here.

Awards

In 2011, Jeff was a Woodington Award recipient from the Measurement Science Conference.

Accomplishments

Jeff is most proud of getting to lead Fluke Corporation's metrology team and seeing the positive impact he's made in metrology and around the world. It was humbling to be asked to lead Fluke metrology, continuing the work of metrologists he admires and holds in such high regard.

Quote

“I have a personal mission statement: to serve, teach and lead my family, humanity, and the world of measurement, live an ethical and balanced life, and make a difference in the world. I make myself very accessible to anyone who wants to learn about metrology and has mentored many people inside and outside Fluke.”